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| 论文题目: | Improvement of the Square Root t Method for Junction Temperature Measurement of SiC MOSFET Power Cycling Test |
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| 作者: | Hao Jin, Jin Zhang, Xiaofeng Jiang |
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| 刊物名称: | The 2nd IEEE International Power Electronics and Application Conference and Symposium（ PEAS 2023）,Guangzhou, China |
| 年: | 2024 |
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Improvement of the Square Root t Method for
Junction Temperature Measurement of SiC
MOSFET Power Cycling Test