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| 论文题目: | An Automatic Optimization Algorithm of SiC MOSFET Power Cycling Test parameters Based on the Device Thermal Networks |
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| 作者: | Hao Jin; Jin Zhang; Xinyu Zou; Yao Yan |
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| 刊物名称: | PCIM Asia 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management，（PCIM Asia 2024）, 28 – 30 August 2024, Shenzhen, China |
| 年: | 2024 |
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An Automatic Optimization Algorithm of SiC MOSFET Power Cycling Test parameters Based on the Device Thermal Networks